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ResLog Plots as an Empirical Metric of the Quality of Cryo-EM Reconstructions
Compared to the field of X-ray crystallography, the field of single particle three-dimensional electron microscopy has few reliable metrics for assessing the quality of 3D reconstructions. New metrics are needed that can determine whether a given 3D reconstruction accurately reflects the structure o...
में बचाया:
| मुख्य लेखकों: | , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
2013
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4001718/ https://ncbi.nlm.nih.gov/pubmed/24384117 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2013.12.010 |
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