Prakash, A., Maikap, S., Chiu, H., Tien, T., & Lai, C. (2013). Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface. Springer.
Citação norma ChicagoPrakash, Amit, Siddheswar Maikap, Hsien-Chin Chiu, Ta-Chang Tien, and Chao-Sung Lai. Retraction: Enhanced Resistive Switching Memory Characteristics and Mechanism Using a Ti Nanolayer At the W/TaOx Interface. Springer, 2013.
MLA citiranjePrakash, Amit, et al. Retraction: Enhanced Resistive Switching Memory Characteristics and Mechanism Using a Ti Nanolayer At the W/TaOx Interface. Springer, 2013.
Opozorilo: Ti citati niso vedno 100% točni.