APA citiranje

Chong Leong, G., & Uda, H. (2013). Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging. Public Library of Science.

Citação norma Chicago

Chong Leong, Gan, and Hashim Uda. Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging. Public Library of Science, 2013.

MLA citiranje

Chong Leong, Gan, and Hashim Uda. Comparative Reliability Studies and Analysis of Au, Pd-Coated Cu and Pd-Doped Cu Wire in Microelectronics Packaging. Public Library of Science, 2013.