Barty, A., Caleman, C., Aquila, A., Timneanu, N., Lomb, L., White, T. A., . . . Chapman, H. N. (2011). Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements.
Chicago-stil citatBarty, Anton, et al. Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements. 2011.
MLA-referensBarty, Anton, et al. Self-terminating Diffraction Gates Femtosecond X-ray Nanocrystallography Measurements. 2011.
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