Henning, A., Günzburger, G., Jöhr, R., Rosenwaks, Y., Bozic-Weber, B., Housecroft, C. E., . . . Glatzel, T. (2013). Kelvin probe force microscopy of nanocrystalline TiO(2) photoelectrodes. Beilstein-Institut.
シカゴスタイル引用形Henning, Alex, Gino Günzburger, Res Jöhr, Yossi Rosenwaks, Biljana Bozic-Weber, Catherine E. Housecroft, Edwin C. Constable, Ernst Meyer, , Thilo Glatzel. Kelvin Probe Force Microscopy of Nanocrystalline TiO(2) Photoelectrodes. Beilstein-Institut, 2013.
MLA引用形式Henning, Alex, et al. Kelvin Probe Force Microscopy of Nanocrystalline TiO(2) Photoelectrodes. Beilstein-Institut, 2013.
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