Gregoire, J. M., Xiao, K., McCluskey, P. J., Dale, D., Cuddalorepatta, G., & Vlassak, J. J. (2013). In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe(0.84)Ni(0.16) thin-film sample. AIP Publishing LLC.
Styl cytowania ChicagoGregoire, John M., Kechao Xiao, Patrick J. McCluskey, Darren Dale, Gayatri Cuddalorepatta, i Joost J. Vlassak. In-situ X-ray Diffraction Combined With Scanning AC Nanocalorimetry Applied to a Fe(0.84)Ni(0.16) Thin-film Sample. AIP Publishing LLC, 2013.
Styl cytowania MLAGregoire, John M., et al. In-situ X-ray Diffraction Combined With Scanning AC Nanocalorimetry Applied to a Fe(0.84)Ni(0.16) Thin-film Sample. AIP Publishing LLC, 2013.
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