Frade, M., Enguita, J. M., & Álvarez, I. (2013). In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer. Molecular Diversity Preservation International (MDPI).
Dyfyniad Arddull ChicagoFrade, María, José María Enguita, and Ignacio Álvarez. In-Situ Waviness Characterization of Metal Plates By a Lateral Shearing Interferometric Profilometer. Molecular Diversity Preservation International (MDPI), 2013.
Dyfyniad MLAFrade, María, José María Enguita, and Ignacio Álvarez. In-Situ Waviness Characterization of Metal Plates By a Lateral Shearing Interferometric Profilometer. Molecular Diversity Preservation International (MDPI), 2013.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.