Ryu, S., & Yellen, G. (2012). Charge movement in gating-locked HCN channels reveals weak coupling of voltage sensors and gate. The Rockefeller University Press.
Chicago ZitierstilRyu, Sujung, und Gary Yellen. Charge Movement in Gating-locked HCN Channels Reveals Weak Coupling of Voltage Sensors and Gate. The Rockefeller University Press, 2012.
MLA ZitierstilRyu, Sujung, und Gary Yellen. Charge Movement in Gating-locked HCN Channels Reveals Weak Coupling of Voltage Sensors and Gate. The Rockefeller University Press, 2012.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.