Ryu, S., & Yellen, G. (2012). Charge movement in gating-locked HCN channels reveals weak coupling of voltage sensors and gate. The Rockefeller University Press.
Chicago-tyylinen lähdeviittausRyu, Sujung, ja Gary Yellen. Charge Movement in Gating-locked HCN Channels Reveals Weak Coupling of Voltage Sensors and Gate. The Rockefeller University Press, 2012.
MLA-viiteRyu, Sujung, ja Gary Yellen. Charge Movement in Gating-locked HCN Channels Reveals Weak Coupling of Voltage Sensors and Gate. The Rockefeller University Press, 2012.
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