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X-ray Image Classification Using Random Forests with Local Wavelet-Based CS-Local Binary Patterns
This paper presents a fast and efficient method for classifying X-ray images using random forests with proposed local wavelet-based local binary pattern (LBP) to improve image classification performance and reduce training and testing time. Most studies on local binary patterns and its modifications...
שמור ב:
| Main Authors: | , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Springer-Verlag
2011
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3222545/ https://ncbi.nlm.nih.gov/pubmed/21487837 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s10278-011-9380-3 |
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