Cita APA

Turzhitsky, V., Mutyal, N. N., Radosevich, A. J., & Backman, V. (2011). Multiple scattering model for the penetration depth of low-coherence enhanced backscattering. Society of Photo-Optical Instrumentation Engineers (SPIE).

Citación estilo Chicago

Turzhitsky, Vladimir, Nikhil N. Mutyal, Andrew J. Radosevich, y Vadim Backman. Multiple Scattering Model for the Penetration Depth of Low-coherence Enhanced Backscattering. Society of Photo-Optical Instrumentation Engineers (SPIE), 2011.

Cita MLA

Turzhitsky, Vladimir, Nikhil N. Mutyal, Andrew J. Radosevich, y Vadim Backman. Multiple Scattering Model for the Penetration Depth of Low-coherence Enhanced Backscattering. Society of Photo-Optical Instrumentation Engineers (SPIE), 2011.