Cita APA

Chen, Y., Busscher, H. J., van der Mei, H. C., & Norde, W. (2011). Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy. American Society for Microbiology.

Citación estilo Chicago

Chen, Yun, Henk J. Busscher, Henny C. van der Mei, y Willem Norde. Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces As Measured Using Atomic Force Microscopy. American Society for Microbiology, 2011.

Cita MLA

Chen, Yun, Henk J. Busscher, Henny C. van der Mei, y Willem Norde. Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces As Measured Using Atomic Force Microscopy. American Society for Microbiology, 2011.