Chen, Y., Busscher, H. J., van der Mei, H. C., & Norde, W. (2011). Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy. American Society for Microbiology.
Styl cytowania ChicagoChen, Yun, Henk J. Busscher, Henny C. van der Mei, i Willem Norde. Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces As Measured Using Atomic Force Microscopy. American Society for Microbiology, 2011.
Styl cytowania MLAChen, Yun, Henk J. Busscher, Henny C. van der Mei, i Willem Norde. Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces As Measured Using Atomic Force Microscopy. American Society for Microbiology, 2011.