एपीए उद्धरण

Turzhitsky, V., Radosevich, A. J., Rogers, J. D., Mutyal, N. N., & Backman, V. (2011). Measurement of optical scattering properties with low-coherence enhanced backscattering spectroscopy. Society of Photo-Optical Instrumentation Engineers (SPIE).

शिकागो स्टाइल उद्धरण

Turzhitsky, Vladimir, Andrew J. Radosevich, Jeremy D. Rogers, Nikhil N. Mutyal, और Vadim Backman. Measurement of Optical Scattering Properties With Low-coherence Enhanced Backscattering Spectroscopy. Society of Photo-Optical Instrumentation Engineers (SPIE), 2011.

एमएलए उद्धरण

Turzhitsky, Vladimir, et al. Measurement of Optical Scattering Properties With Low-coherence Enhanced Backscattering Spectroscopy. Society of Photo-Optical Instrumentation Engineers (SPIE), 2011.