APA Citatie

Jang, M., Park, Y., Jun, M., Hyun, Y., Choi, S., & Zyung, T. (2010). The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process. Springer.

Chicago Style citaat

Jang, Moongyu, Youngsam Park, Myungsim Jun, Younghoon Hyun, Sung-Jin Choi, en Taehyoung Zyung. The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured By CMOS Compatible Process. Springer, 2010.

MLA citatie

Jang, Moongyu, et al. The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured By CMOS Compatible Process. Springer, 2010.