Jang, M., Park, Y., Jun, M., Hyun, Y., Choi, S., & Zyung, T. (2010). The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process. Springer.

Jang, Moongyu, Youngsam Park, Myungsim Jun, Younghoon Hyun, Sung-Jin Choi, and Taehyoung Zyung. The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured By CMOS Compatible Process. Springer, 2010.

Jang, Moongyu, et al. The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured By CMOS Compatible Process. Springer, 2010.