Xu, Y., Engl, W. C., Jerison, E. R., Wallenstein, K. J., Hyland, C., Wilen, L. A., & Dufresne, E. R. (2010). Imaging in-plane and normal stresses near an interface crack using traction force microscopy. National Academy of Sciences.

Xu, Ye, Wilfried C. Engl, Elizabeth R. Jerison, Kevin J. Wallenstein, Callen Hyland, Larry A. Wilen, و Eric R. Dufresne. Imaging In-plane and Normal Stresses Near an Interface Crack Using Traction Force Microscopy. National Academy of Sciences, 2010.

Xu, Ye, et al. Imaging In-plane and Normal Stresses Near an Interface Crack Using Traction Force Microscopy. National Academy of Sciences, 2010.