APA استشهاد

Xu, Y., Engl, W. C., Jerison, E. R., Wallenstein, K. J., Hyland, C., Wilen, L. A., & Dufresne, E. R. (2010). Imaging in-plane and normal stresses near an interface crack using traction force microscopy. National Academy of Sciences.

استشهاد بنمط شيكاغو

Xu, Ye, Wilfried C. Engl, Elizabeth R. Jerison, Kevin J. Wallenstein, Callen Hyland, Larry A. Wilen, و Eric R. Dufresne. Imaging In-plane and Normal Stresses Near an Interface Crack Using Traction Force Microscopy. National Academy of Sciences, 2010.

MLA استشهاد

Xu, Ye, et al. Imaging In-plane and Normal Stresses Near an Interface Crack Using Traction Force Microscopy. National Academy of Sciences, 2010.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.