Xu, Y., Engl, W. C., Jerison, E. R., Wallenstein, K. J., Hyland, C., Wilen, L. A., & Dufresne, E. R. (2010). Imaging in-plane and normal stresses near an interface crack using traction force microscopy. National Academy of Sciences.
Chicago Style CitationXu, Ye, Wilfried C. Engl, Elizabeth R. Jerison, Kevin J. Wallenstein, Callen Hyland, Larry A. Wilen, and Eric R. Dufresne. Imaging In-plane and Normal Stresses Near an Interface Crack Using Traction Force Microscopy. National Academy of Sciences, 2010.
MLA CitationXu, Ye, et al. Imaging In-plane and Normal Stresses Near an Interface Crack Using Traction Force Microscopy. National Academy of Sciences, 2010.
Warning: These citations may not always be 100% accurate.