APA استشهاد

Perret, E., Nygård, K., Satapathy, D. K., Balmer, T. E., Bunk, O., Heuberger, M., & van der Veen, J. F. (2010). X-ray reflectivity theory for determining the density profile of a liquid under nanometre confinement. International Union of Crystallography.

استشهاد بنمط شيكاغو

Perret, Edith, Kim Nygård, Dillip K. Satapathy, Tobias E. Balmer, Oliver Bunk, Manfred Heuberger, و J. Friso van der Veen. X-ray Reflectivity Theory for Determining the Density Profile of a Liquid Under Nanometre Confinement. International Union of Crystallography, 2010.

MLA استشهاد

Perret, Edith, et al. X-ray Reflectivity Theory for Determining the Density Profile of a Liquid Under Nanometre Confinement. International Union of Crystallography, 2010.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.