Kuhls-Gilcrist, A., Bednarek, D. R., & Rudin, S. (2009). Component analysis of a new Solid State X-ray Image Intensifier (SSXII) using photon transfer and Instrumentation Noise Equivalent Exposure (INEE) measurements.
استشهاد بنمط شيكاغوKuhls-Gilcrist, Andrew, Daniel R. Bednarek, و Stephen Rudin. Component Analysis of a New Solid State X-ray Image Intensifier (SSXII) Using Photon Transfer and Instrumentation Noise Equivalent Exposure (INEE) Measurements. 2009.
MLA استشهادKuhls-Gilcrist, Andrew, Daniel R. Bednarek, و Stephen Rudin. Component Analysis of a New Solid State X-ray Image Intensifier (SSXII) Using Photon Transfer and Instrumentation Noise Equivalent Exposure (INEE) Measurements. 2009.
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