Unraveling the Complex Trait of Crop Yield With Quantitative Trait Loci Mapping in Brassica napus

Yield is the most important and complex trait for the genetic improvement of crops. Although much research into the genetic basis of yield and yield-associated traits has been reported, in each such experiment the genetic architecture and determinants of yield have remained ambiguous. One of the mos...

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Bibliographic Details
Main Authors: Shi, Jiaqin, Li, Ruiyuan, Qiu, Dan, Jiang, Congcong, Long, Yan, Morgan, Colin, Bancroft, Ian, Zhao, Jianyi, Meng, Jinling
Format: Artigo
Language:Inglês
Published: Genetics Society of America 2009
Subjects:
Investigations
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC2710164/
https://ncbi.nlm.nih.gov/pubmed/19414564
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1534/genetics.109.101642
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