Poythress, N. G., Skeem, J. L., Weir, J., Lilienfeld, S. O., Douglas, K. S., Edens, J. F., & Kennealy, P. J. (2008). Psychometric Properties of Carver and White's (1994) BIS/BAS Scales in a Large Sample of Offenders.
Chicago Style citaatPoythress, Norman G., Jennifer L. Skeem, John Weir, Scott O. Lilienfeld, Kevin S. Douglas, John F. Edens, en Patrick J. Kennealy. Psychometric Properties of Carver and White's (1994) BIS/BAS Scales in a Large Sample of Offenders. 2008.
MLA citatiePoythress, Norman G., et al. Psychometric Properties of Carver and White's (1994) BIS/BAS Scales in a Large Sample of Offenders. 2008.
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