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Feedback Effects in Combined Fast-Scan Cyclic Voltammetry-Scanning Electrochemical Microscopy

Fast-scan cyclic voltammetry at scan rates between 5 and 1000 Vs(−1) was performed at the tip of a scanning electrochemical microscope immersed in a solution of redox mediator. The effect of conducting and insulating substrates on the voltammetric signal was investigated as a function of scan rate a...

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Bibliografische gegevens
Hoofdauteurs: Schrock, Daniel S., Wipf, David O., Baur, John E.
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: 2007
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC2525741/
https://ncbi.nlm.nih.gov/pubmed/17550230
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac0703911
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