Mosbacher, J., Langer, M., Hörber, J., & Sachs, F. (1998). Voltage-dependent Membrane Displacements Measured by Atomic Force Microscopy. The Rockefeller University Press.
Dyfyniad Arddull ChicagoMosbacher, J., M. Langer, J.K.H Hörber, and F. Sachs. Voltage-dependent Membrane Displacements Measured By Atomic Force Microscopy. The Rockefeller University Press, 1998.
Dyfyniad MLAMosbacher, J., M. Langer, J.K.H Hörber, and F. Sachs. Voltage-dependent Membrane Displacements Measured By Atomic Force Microscopy. The Rockefeller University Press, 1998.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.