Chargement en cours...

Diallel-cross analysis of grain yield and stress tolerance-related traits under semi-arid conditions in Durum wheat (Triticum durum Desf.)

Half-diallel analysis with six genotypes of durum wheat was conducted for grain yield, yield components and agronomictraits related to abiotic stress tolerance. Aim of this study is to identify best parents for hybridization. Cultivar GuemgoumRkhem proved to be best general combiner for number of da...

Description complète

Enregistré dans:
Détails bibliographiques
Auteur principal: HANNACHI Abderrahmane, FELLAHI Zine El Abidine, BOUZERZOUR Hamenna and BOUTAKRABT Ammar
Format: Artigo
Langue:Inglês
Publié: Indian Society of Plant Breeders 2013-03-01
Collection:Electronic Journal of Plant Breeding
Sujets:
Accès en ligne:https://sites.google.com/site/ejpb2011/vol-4-1/EJPB_V4_N1_1027_1033.pdf?attredirects=0
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!