Načítá se...

Diallel-cross analysis of grain yield and stress tolerance-related traits under semi-arid conditions in Durum wheat (Triticum durum Desf.)

Half-diallel analysis with six genotypes of durum wheat was conducted for grain yield, yield components and agronomictraits related to abiotic stress tolerance. Aim of this study is to identify best parents for hybridization. Cultivar GuemgoumRkhem proved to be best general combiner for number of da...

Celý popis

Uloženo v:
Podrobná bibliografie
Hlavní autor: HANNACHI Abderrahmane, FELLAHI Zine El Abidine, BOUZERZOUR Hamenna and BOUTAKRABT Ammar
Médium: Artigo
Jazyk:Inglês
Vydáno: Indian Society of Plant Breeders 2013-03-01
Edice:Electronic Journal of Plant Breeding
Témata:
On-line přístup:https://sites.google.com/site/ejpb2011/vol-4-1/EJPB_V4_N1_1027_1033.pdf?attredirects=0
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!