Nabiyouni, G. (2007). Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films. Isfahan University of Technology.
Citação norma ChicagoNabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
MLA引文Nabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
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