Nabiyouni, G. (2007). Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films. Isfahan University of Technology.
Chicago-stil citatNabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
MLA-referensNabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
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