Nabiyouni, G. (2007). Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films. Isfahan University of Technology.
Styl cytowania ChicagoNabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
Styl cytowania MLANabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
Uwaga: Te cytaty mogą odróżniać się od wytycznej twojego fakultetu..