Nabiyouni, G. (2007). Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films. Isfahan University of Technology.
Stile di citazione ChicagoNabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
Citazione MLANabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.