Nabiyouni, G. (2007). Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films. Isfahan University of Technology.
Citación estilo ChicagoNabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
Cita MLANabiyouni, Gholamreza. Dependence of Resistivity of Electrodeposited Ni Single Layer and Ni/Cu Multilayer Thin Films On the Film Thickness, and Electron Mean Free Path Measurements of These Films. Isfahan University of Technology, 2007.
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