Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures

By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underl...

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Bibliografiske detaljer
Main Authors: J. Unguris, S. R. Bowden, D. T. Pierce, M. Trassin, R. Ramesh, S.-W. Cheong, S. Fackler, I. Takeuchi
Format: Artigo
Sprog:Inglês
Udgivet: AIP Publishing LLC 2014-07-01
Serier:APL Materials
Online adgang:http://dx.doi.org/10.1063/1.4890055
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