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Piezoelectricity and charge trapping in ZnO and Co-doped ZnO thin films
Piezoelectricity and charge storage of undoped and Co-doped ZnO thin films were investigated by means of PiezoResponse Force Microscopy and Kelvin Probe Force Microscopy. We found that Co-doped ZnO exhibits a large piezoelectric response, with the mean value of piezoelectric matrix element d33 sligh...
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| Главные авторы: | , , , , , , |
|---|---|
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
AIP Publishing LLC
2017-05-01
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| Серии: | AIP Advances |
| Online-ссылка: | http://dx.doi.org/10.1063/1.4983474 |
| Метки: |
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