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Piezoelectricity and charge trapping in ZnO and Co-doped ZnO thin films
Piezoelectricity and charge storage of undoped and Co-doped ZnO thin films were investigated by means of PiezoResponse Force Microscopy and Kelvin Probe Force Microscopy. We found that Co-doped ZnO exhibits a large piezoelectric response, with the mean value of piezoelectric matrix element d33 sligh...
Tallennettuna:
| Päätekijät: | , , , , , , |
|---|---|
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
AIP Publishing LLC
2017-05-01
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| Sarja: | AIP Advances |
| Linkit: | http://dx.doi.org/10.1063/1.4983474 |
| Tagit: |
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