Piezoelectricity and charge trapping in ZnO and Co-doped ZnO thin films

Piezoelectricity and charge storage of undoped and Co-doped ZnO thin films were investigated by means of PiezoResponse Force Microscopy and Kelvin Probe Force Microscopy. We found that Co-doped ZnO exhibits a large piezoelectric response, with the mean value of piezoelectric matrix element d33 sligh...

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Hlavní autoři: Domenico D’Agostino, Cinzia Di Giorgio, Antonio Di Trolio, Anita Guarino, Anna Maria Cucolo, Antonio Vecchione, Fabrizio Bobba
Médium: Artigo
Jazyk:Inglês
Vydáno: AIP Publishing LLC 2017-05-01
Edice:AIP Advances
On-line přístup:http://dx.doi.org/10.1063/1.4983474
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