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Low-Temperature Annealing Induced Amorphization in Nanocrystalline NiW Alloy Films

Annealing induced amorphization in sputtered glass-forming thin films was generally observed in the supercooled liquid region. Based on X-ray diffraction and transmission electron microscope (TEM) analysis, however, here, we demonstrate that nearly full amorphization could occur in nanocrystalline (...

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Bibliografiset tiedot
Päätekijät: Z. Q. Chen, F. Wang, P. Huang, T. J. Lu, K. W. Xu
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Hindawi Limited 2013-01-01
Sarja:Journal of Nanomaterials
Linkit:http://dx.doi.org/10.1155/2013/252965
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