Načítá se...

Low-Temperature Annealing Induced Amorphization in Nanocrystalline NiW Alloy Films

Annealing induced amorphization in sputtered glass-forming thin films was generally observed in the supercooled liquid region. Based on X-ray diffraction and transmission electron microscope (TEM) analysis, however, here, we demonstrate that nearly full amorphization could occur in nanocrystalline (...

Celý popis

Uloženo v:
Podrobná bibliografie
Hlavní autoři: Z. Q. Chen, F. Wang, P. Huang, T. J. Lu, K. W. Xu
Médium: Artigo
Jazyk:Inglês
Vydáno: Hindawi Limited 2013-01-01
Edice:Journal of Nanomaterials
On-line přístup:http://dx.doi.org/10.1155/2013/252965
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!