Ładuje się......
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
Quartz tuning forks that have a probe tip attached to the end of one of its prongs while the other prong is arrested to a holder (“qPlus” configuration) have gained considerable popularity in recent years for high-resolution atomic force microscopy imaging. The small size of the tuning forks and the...
Zapisane w:
Główni autorzy: | , |
---|---|
Format: | Artigo |
Język: | Inglês |
Wydane: |
Beilstein-Institut
2017-03-01
|
Seria: | Beilstein Journal of Nanotechnology |
Hasła przedmiotowe: | |
Dostęp online: | https://doi.org/10.3762/bjnano.8.70 |
Etykiety: |
Dodaj etykietę
Nie ma etykietki, Dołącz pierwszą etykiete!
|