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Analysis of QualitySpec Trek Reflectance from Vertical Profiles of Taiga Snowpack
Snow microstructure is an important factor for microwave and optical remote sensing of snow. One parameter used to describe it is the specific surface area (SSA), which is defined as the surface-area-to-mass ratio of snow grains. Reflectance at near infrared (NIR) and short-wave infrared (SWIR) wave...
Gorde:
| Egile Nagusiak: | , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
MDPI AG
2018-11-01
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| Saila: | Geosciences |
| Gaiak: | |
| Sarrera elektronikoa: | https://www.mdpi.com/2076-3263/8/11/404 |
| Etiketak: |
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