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Characterization of CdO film AFM and XRD Diffraction Using Rietveld Refinement
Nano particles of Cadmium Oxide (CdO) thin films were prepared by spray pyrolysis technique. The synthesized film is annealed at (200 , 300, 450) o C for 3 hours . The XRD and AFM for the analysis of its structural and micro-structural characteristic has been preformed. The average grain size was...
Gorde:
| Egile Nagusiak: | , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
University of Baghdad
2017-04-01
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| Saila: | Ibn Al-Haitham Journal for Pure and Applied Sciences |
| Gaiak: | |
| Sarrera elektronikoa: | https://jih.uobaghdad.edu.iq/index.php/j/article/view/364 |
| Etiketak: |
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