Tietueen sitaatit

APA-viite (7. p.)
Memic, E., Graeff-Hönninger, S., Hensel, O., & Batchelor, W. D. (2020). Extending the CSM-CERES-Beet Model to Simulate Impact of Observed Leaf Disease Damage on Sugar Beet Yield. MDPI AG.
Chicago-viite (17. p.)
Memic, Emir, Simone Graeff-Hönninger, Oliver Hensel, ja William D. Batchelor. Extending the CSM-CERES-Beet Model to Simulate Impact of Observed Leaf Disease Damage on Sugar Beet Yield. MDPI AG, 2020.
MLA-viite (9. p.)
Memic, Emir, et al. Extending the CSM-CERES-Beet Model to Simulate Impact of Observed Leaf Disease Damage on Sugar Beet Yield. MDPI AG, 2020.
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