Tietueen sitaatit

APA-viite (7. p.)
Liu, L., Li, Y., Liu, Q., Sun, H., Sun, Y., & Shen, X. (2026). YOLO-ALD: An Efficient and Robust Lightweight Model for Apple Leaf Disease Detection in Complex Orchard Environments. MDPI AG.
Chicago-viite (17. p.)
Liu, Lei, Yinyin Li, Qingyu Liu, Huihui Sun, Yeguo Sun, ja Xiaobo Shen. YOLO-ALD: An Efficient and Robust Lightweight Model for Apple Leaf Disease Detection in Complex Orchard Environments. MDPI AG, 2026.
MLA-viite (9. p.)
Liu, Lei, et al. YOLO-ALD: An Efficient and Robust Lightweight Model for Apple Leaf Disease Detection in Complex Orchard Environments. MDPI AG, 2026.
Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.