The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

by Motoo Ito, Naotaka Tomioka, Kentaro Uesugi, Masayuki Uesugi, Yu Kodama, Ikuya Sakurai, Ikuo Okada, Takuji Ohigashi, Hayato Yuzawa, Akira Yamaguchi, Naoya Imae, Yuzuru Karouji, Naoki Shirai, Toru Yada, Masanao Abe
Published 2020-09-01