Resultats de la cerca - Sebastien Fregonese

Establishing On-Wafer Calibration Standards for the 16-Term Error Model: Application to Silicon High-Frequency Transistor Characterization per Sebastien Fregonese, Thomas Zimmer

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Source-Pull and Load-Pull Characterization of Graphene FET per Sebastien Fregonese, Magali de Matos, David Mele, Cristell Maneux, Henri Happy, Thomas Zimmer

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THz Characterization and Modeling of SiGe HBTs: Review (Invited) per Sebastien Fregonese, Marina Deng, Marco Cabbia, Chandan Yadav, Magali De Matos, Thomas Zimmer

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SiGe HBTs Optimization for Wireless Power Amplifier Applications per Pierre-Marie Mans, Sebastien Jouan, Sebastien Fregonese, Benoit Vandelle, Denis Pache, Caroline Arnaud, Cristell Maneux, Thomas Zimmer

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A Broadband Active Microwave Monolithically Integrated Circuit Balun in Graphene Technology per Dalal Fadil, Vikram Passi, Wei Wei, Soukaina Ben Salk, Di Zhou, Wlodek Strupinski, Max C. Lemme, Thomas Zimmer, Emiliano Pallecchi, Henri Happy, Sebastien Fregonese

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SiGe HBTs and BiCMOS Technology for Present and Future Millimeter-Wave Systems per Thomas Zimmer, Josef Bock, Fred Buchali, Pascal Chevalier, Michael Collisi, Bjorn Debaillie, Marina Deng, Philippe Ferrari, Sebastien Fregonese, Christophe Gaquiere, Haitham Ghanem, Horst Hettrich, Alper Karakuzulu, Tim Maiwald, Marc Margalef-Rovira, Caroline Maye, Michael Moller, Anindya Mukherjee, Holger Rucker, Paulius Sakalas, Rolf Schmid, Karina Disch, Karsten Schuh, Wolfgang Templ, Akshay Visweswaran, Thomas Zwick

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