High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the European XFEL

by Alberto De Fanis, Markus Ilchen, Alexander Achner, Thomas M. Baumann, Rebecca Boll, Jens Buck, Cyril Danilevsky, Sergey Esenov, Benjamin Erk, Patrik Grychtol, Gregor Hartmann, Jia Liu, Tommaso Mazza, Jacobo Montaño, Valerija Music, Yevheniy Ovcharenko, Nils Rennhack, Daniel Rivas, Daniel Rolles, Philipp Schmidt, Hamed Sotoudi Namin, Frank Scholz, Jens Viefhaus, Peter Walter, Pawel Ziółkowski, Haiou Zhang, Michael Meyer
Published 2022-05-01