Resultados de búsqueda - Matteo Buffolo

Dynamic Performance Characterization Techniques in Gallium Nitride-Based Electronic Devices por Carlo De Santi, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode por Claudia Casu, Matteo Buffolo, Alessandro Caria, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini

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Efficiency- and lifetime-limiting effects of commercially available UVC LEDs: a review por Grigory Onushkin, Jan Ruschel, Francesco Piva, Matteo Buffolo, Jens Rass, Lynn Davis, Nicola Trivellin, Carlo De Santi, Willem van Driel, Matteo Meneghini

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Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p⁺n⁻n Diodes: The Road to Reliable Vertical MOSFETs por Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Andrea Gerosa, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes por Alexander Herzog, Matteo Buffolo, Francesco Piva, Simon Benkner, Babak Zandi, Jens Balasus, Paul Myland, Felix Wirth, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh

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Quantitative modeling of threshold instability in β-Ga2O3 finFETs through electro-optical investigation por Manuel Fregolent, Francesco Piva, Carlo De Santi, Matteo Buffolo, Wenshen Li, Kazuki Nomoto, Zongyang Hu, Debdeep Jena, Huili Grace Xing, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Investigating the optical degradation of InAs quantum dot lasers on silicon through combined electro-optical characterization and gain measurements por Michele Zenari, Marco Novarese, Matteo Buffolo, Carlo De Santi, Justin Norman, Eamonn T Hughes, John E Bowers, Robert W Herrick, Mariangela Gioannini, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs por Nicola Roccato, Francesco Piva, Carlo De Santi, Matteo Buffolo, Normal Susilo, Daniel Hauer Vidal, Anton Muhin, Luca Sulmoni, Tim Wernicke, Micheal Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Modeling the capacitance–voltage characteristics of AlGaN-based UV-C LEDs por Nicola Roccato, Francesco Piva, Matteo Buffolo, Carlo De Santi, Nicola Trivellin, Marcel Schilling, Anton Muhin, Jakob Höpfner, Martin Guttmann, Tim Wernicke, Michael Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Diffusion mechanism as cause of optical degradation in AlGaN-based UV-C leds investigated by TCAD simulations por Nicola Roccato, Francesco Piva, Matteo Buffolo, Carlo De Santi, Nicola Trivellin, Norman Susilo, Daniel Hauer Vidal, Anton Muhin, Luca Sulmoni, Tim Wernicke, Michael Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Negative Activation Energy of Gate Reliability in Schottky-Gate p-GaN HEMTs: Combined Gate Leakage Current Modeling and Spectral Electroluminescence Investigation por Manuel Fregolent, Mirco Boito, Michele Disaro, Carlo De Santi, Matteo Buffolo, Eleonora Canato, Michele Gallo, Cristina Miccoli, Isabella Rossetto, Giansalvo Pizzo, Alfio Russo, Ferdinando Iucolano, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Quality Assessment of Perovskite Solar Cells: An Industrial Point of View por Nicolò Lago, Francesco Moretti, Noah Tormena, Alessandro Caria, Matteo Buffolo, Carlo De Santi, Nicola Trivellin, Andrea Cester, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Fabio Matteocci, Jessica Barichello, Luigi Vesce, Aldo Di Carlo, Federico Quartiani

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