Property Variation in Wavelength-thick Epsilon-Near-Zero ITO Metafilm for Near IR Photonic Devices

por Ni, Jimmy H., Sarney, Wendy L., Leff, Asher C., Cahill, James P., Zhou, Weimin
Publicado en Sci Rep (2020)

Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity

por Hart, James L., Lang, Andrew C., Leff, Asher C., Longo, Paolo, Trevor, Colin, Twesten, Ray D., Taheri, Mitra L.
Publicado en Sci Rep (2017)