Mapping a Large Number of QTL for Durable Resistance to Stripe Rust in Winter Wheat Druchamp Using SSR and SNP Markers

Autor Hou, Lu, Chen, Xianming, Wang, Meinan, See, Deven R., Chao, Shiaoman, Bulli, Peter, Jing, Jinxue
Vydáno v PLoS One (2015)