Resultados da busca - Ingo Ortlepp

Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality... por Ingo Ortlepp, Jaqueline Stauffenberg, Eberhard Manske

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Phase-Modulated Standing Wave Interferometer por Ingo Ortlepp, Eberhard Manske, Jens-Peter Zöllner, Ivo W. Rangelow

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Phase-Modulated Standing Wave Interferometer por Ingo Ortlepp, Eberhard Manske, Jens-Peter Zöllner, Ivo W. Rangelow

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A GPS-Referenced Wavelength Standard for High-Precision Displacement Interferometry at λ = 633 nm por Ulrike Blumröder, Paul Köchert, Thomas Fröhlich, Thomas Kissinger, Ingo Ortlepp, Jens Flügge, Harald Bosse, Eberhard Manske

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Measurement Precision of a Planar Nanopositioning Machine with a Range of Motion of Ø100 mm por Jaqueline Stauffenberg, Ingo Ortlepp, Johannes Belkner, Denis Dontsov, Enrico Langlotz, Steffen Hesse, Ivo Rangelow, Eberhard Manske

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Enhanced Vectorial Measurement Uncertainty Model por Ingo Ortlepp, Simon Eisele, Kevin Treptow, Josias Rühle, Christof Pruß, Tobias Haist, Stephan Reichelt, Oliver Sawodny, Eberhard Manske, Thomas Kissinger

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Tip-based nanofabrication below 40 nm combined with a nanopositioning machine with a movement range of Ø100 mm por Jaqueline Stauffenberg, Michael Reibe, Anja Krötschl, Christoph Reuter, Ingo Ortlepp, Denis Dontsov, Steffen Hesse, Ivo W. Rangelow, Steffen Strehle, Eberhard Manske

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Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100) por Jaqueline Stauffenberg, Ingo Ortlepp, Christoph Reuter, Mathias Holz, Denis Dontsov, Christoph Schäffel, Steffen Strehle, Jens-Peter Zöllner, Ivo W. Rangelow, Eberhard Manske

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